Multi-matrix opto-electronic system for measuring de-formation of the millimeter range radiotelescope ele-ments

Ren-pu LI; Igor Konyakhin; Hoa Tong Minh; Min ZHOU

doi:10.1007/s11801-019-8191-5

Journals >Optoelectronics Letters >Volume 15 >Issue 2 >Page 144 > Article

Optoelectronics Letters
Vol. 15, Issue 2, 144 (2019)

Multi-matrix opto-electronic system for measuring de-formation of the millimeter range radiotelescope ele-ments

Ren-pu LI¹, Igor Konyakhin², Hoa Tong Minh², and Min ZHOU^1,*

Author Affiliations

¹Chongqing Engineering Research Center of Intelligent Sensing Technology and Microsystem, Chongqing University of Post and Telecommunications, Chongqing 400065, China

²Faculty of Applied Optic, ITMO University, Saint Petersburg 197101, Russia

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DOI: 10.1007/s11801-019-8191-5 Cite this Article

LI Ren-pu, Konyakhin Igor, Tong Minh Hoa, ZHOU Min. Multi-matrix opto-electronic system for measuring de-formation of the millimeter range radiotelescope ele-ments[J]. Optoelectronics Letters, 2019, 15(2): 144 Copy Citation Text

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Abstract

A novel optical instrument is proposed and studied to measure the deformation of each connection point for a mirror, which includes 24 multi-matrix base units and can be used in millimeter-scale signal reflection systems. Experimental investigations reveal that the error of measurement is σ=8.7×10-3 mm at a distance of 5 500 mm, which allows to measure the linear deformation of a radiotelescope with the mirror diameter of 70 m.

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