Refractive index measurement of dielectric samples using highly focused radially polarized light (Invited Paper)

Guadalupe López-Morales; Victor-Manuel Rico-Botero; Rafael Espinosa-Luna; Qiwen Zhan

doi:10.3788/COL201715.030004

Journals >Chinese Optics Letters >Volume 15 >Issue 3 >Page 030004 > Article

Chinese Optics Letters
Vol. 15, Issue 3, 030004 (2017)

Refractive index measurement of dielectric samples using highly focused radially polarized light (Invited Paper)

Guadalupe López-Morales^1,*, Victor-Manuel Rico-Botero¹, Rafael Espinosa-Luna¹, and Qiwen Zhan²

Author Affiliations

¹GIPYS Laboratory, Centro de Investigaciones en Óptica, A. C., León, Gto 37150, México

²Department of Electro-Optics and Photonics, University of Dayton, Dayton, OH 45469, USA

show less

DOI: 10.3788/COL201715.030004 Cite this Article Set citation alerts

Guadalupe López-Morales, Victor-Manuel Rico-Botero, Rafael Espinosa-Luna, Qiwen Zhan, "Refractive index measurement of dielectric samples using highly focused radially polarized light (Invited Paper)," Chin. Opt. Lett. 15, 030004 (2017) Copy Citation Text

EndNote(RIS)

BibTex

Plain Text

show less

Cited By

Article index updated: Feb. 24, 2023

Citation counts are provided from Web of Science. The counts may vary by service, and are reliant on the availability of their data.