• Infrared Technology
  • Vol. 45, Issue 12, 1358 (2023)
Xueyuan JIN1 and Jinliang CHEN2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    JIN Xueyuan, CHEN Jinliang. Nonlinear Data Fitting for Reflective Continuous Heat Excited Thermography Testing[J]. Infrared Technology, 2023, 45(12): 1358 Copy Citation Text show less

    Abstract

    To quantitatively detect defects using reflective continuous-heat-excited thermography, a heat conduction model of an object under continuous heat excitation was established, and the temperature increment-time relationship on the thermal excitation surface of the object was derived. Based on an analysis of the temperature increment-time relationship on the thermal excitation surface, the depth of the defects could be measured by nonlinear fitting of the temperature increment-time data. To test the feasibility of this method, a GFRP flat-bottomed hole specimen was fabricated and analyzed using reflective continuous-heat-excited thermography. The results show that this method is highly accurate in measuring the depth of defects.