• Electro-Optic Technology Application
  • Vol. 26, Issue 6, 14 (2011)
ZHANG Yong-mei and ZHANG Jian-xin
Author Affiliations
  • [in Chinese]
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    DOI: 1673-1255(2011)06-0014-04 Cite this Article
    ZHANG Yong-mei, ZHANG Jian-xin. Far-field Simulation and Analysis on Laser Irradiation of Electro-optical Detection System[J]. Electro-Optic Technology Application, 2011, 26(6): 14 Copy Citation Text show less
    References

    [1] F Bartoli. Irreversible damage in IR detector materials[J].Appl. Opt, 1977, 16: 2934.

    [2] F Bartoli. Ageneralize in thermal model for laser damage ininfrared detectors[J]. J Appl.Phys,1976,47.2875.

    [3] R H Dyck,W Steffe.Effects of optical crosstalk in CCD im.age sensors[C]// in Proc. 5th Int. Conf on Applications ofCharge-CouPled Devices. San Diego,CA,1978: 55-61.

    [4] James p Lavine,Win-chyi Chang,Constantine N Anagnosto.poulos. Monte-Carlo Simulation of the Photoelectron Cross.talk in Silicon Imaging Devices[C]// IEEE Transactions onComputer-aided Design. CAD-4(4),1985:531-535.

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    ZHANG Yong-mei, ZHANG Jian-xin. Far-field Simulation and Analysis on Laser Irradiation of Electro-optical Detection System[J]. Electro-Optic Technology Application, 2011, 26(6): 14
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