YANG Hao-tian, WANG Li-xin, TIAN Ying, TAN Ji-wen. Bayes Approach for Nonlinear Degradation Process Modeling of Inertial Device RUL Prediction[J]. Electronics Optics & Control, 2016, 23(12): 90

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- Electronics Optics & Control
- Vol. 23, Issue 12, 90 (2016)
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