• Laser & Optoelectronics Progress
  • Vol. 61, Issue 5, 0527001 (2024)
Qixia Tong, Yingying Hu, Deyong He*, and Zhengfu Han**
Author Affiliations
  • CAS Key Laboratory of Quantum Information, University of Science and Technology of China, Hefei 230026, Anhui , China
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    DOI: 10.3788/LOP230839 Cite this Article Set citation alerts
    Qixia Tong, Yingying Hu, Deyong He, Zhengfu Han. Fast Post-processing Method for Practical Quantum Random Number Generators Based on Spontaneous Emission Amplification[J]. Laser & Optoelectronics Progress, 2024, 61(5): 0527001 Copy Citation Text show less
    Experimental schematic diagram for quantum random number generators based on ASE
    Fig. 1. Experimental schematic diagram for quantum random number generators based on ASE
    Best gamma fitting of measured experimental data
    Fig. 2. Best gamma fitting of measured experimental data
    Calculating run lengths of nonuniform sequences.
    Fig. 3. Calculating run lengths of nonuniform sequences.
    Comparison of the time spent on post-processing random bits of different scales between the proposed method and the Toeplitz matrix
    Fig. 4. Comparison of the time spent on post-processing random bits of different scales between the proposed method and the Toeplitz matrix

    Power of ASE /

    mW

    Longest run length of bit sequences TCompression factor ηMin-entropyHmin
    bit-3bit-4bit-5bit-6bit-7
    102626264814564.11
    2022232542184.66
    3022222436134.80
    402325242744.95
    502424322542235.09
    602426321631325.17
    Table 1. Longest run length of bit sequences, compression factor and min-entropy of bit sequences under different ASE power
    Statistical testP-valueProportion
    Frequency0.3267395/400
    Block frequency0.9357394/400
    Cumulative sums0.0213395/400
    Runs0.6371400/400
    Longest run0.1041391/400
    Rank0.0028396/400
    FFT0.3753399/400
    Non overlapping template0.1154397/400
    Overlapping template0.7744397/400
    Universal0.2190396/400
    Approximate entropy0.1742395/400
    Random excursions0.1824243/246
    Random excursions variant0.4607245/246
    Serial0.0609398/400
    Linear complexity0.4846398/400
    Table 2. Results of the NIST-STS test suite for bit sequences19
    Qixia Tong, Yingying Hu, Deyong He, Zhengfu Han. Fast Post-processing Method for Practical Quantum Random Number Generators Based on Spontaneous Emission Amplification[J]. Laser & Optoelectronics Progress, 2024, 61(5): 0527001
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