• Laser Journal
  • Vol. 45, Issue 4, 95 (2024)
CHEN Yifei1, WANG Fanrong1,*, LU Donglin1, and LIU Yifan2
Author Affiliations
  • 1School of Electrical and Electronic Engineering, Hubei University of Technology, Wuhan 430070, China
  • 2Wuhan National Optoelectronic Research Center, Huazhong University of Science and Technology, Wuhan 430072, China
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    DOI: 10.14016/j.cnki.jgzz.2024.04.095 Cite this Article
    CHEN Yifei, WANG Fanrong, LU Donglin, LIU Yifan. A method for detecting surface defects of solar cells based on improved YOLOv5[J]. Laser Journal, 2024, 45(4): 95 Copy Citation Text show less

    Abstract

    Aiming at the shortcomings of traditional PCB board inspection methods, such as low detection efficiency and low detection accuracy, a PCB board defect detection method with improved YOLOv5 model was proposed. In order to improve the precision of small target defect detection, the BiFPN based network connection method is constructed, which makes full use of the feature information of different scales. In order to better capture the position of target defects, we introduced Coordinate Attention mechanism to make model positioning and target capture more accurate. The experimental results show that compared with the original YOLOv5 model, the mean average accuracy of the proposed method for detecting PCB surface defects is improved by 3.2%.
    CHEN Yifei, WANG Fanrong, LU Donglin, LIU Yifan. A method for detecting surface defects of solar cells based on improved YOLOv5[J]. Laser Journal, 2024, 45(4): 95
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