• Optics and Precision Engineering
  • Vol. 22, Issue 9, 2536 (2014)
SHENG Lei1,2,*, WU Zhi-yong1, GAO Shi-jie1, LIU Zhi-chun1..., GAO Ce1 and WANG Shi-gang3|Show fewer author(s)
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.3788/ope.20142209.2536 Cite this Article
    SHENG Lei, WU Zhi-yong, GAO Shi-jie, LIU Zhi-chun, GAO Ce, WANG Shi-gang. Regression and compensation of measuring data for shipboard theodolite[J]. Optics and Precision Engineering, 2014, 22(9): 2536 Copy Citation Text show less

    Abstract

    On the basis of service conditions of a shipboard theodolite, the relationship between ship-attitudes in different scopes and measuring angles was analyzed, a segmented regression model was put forward, and a scheme of regression and compensation for the shipboard optical measurement equipment was given. Firstly, based on the ship-attitude error model and several different residual errors of experimental data, the correlation between the measured variables was analyzed. According to the characteristics of shipboard equipment, a segmented dual-regression model was given, and a regression database was established. Then, an additional observation scheme before mission was proposed for afterward regressing. Finally based on the additional measurement residual errors and the regression database, the compensating method was explained based on measuring condition similarity. The experimental results after compensation by proposed method show that the angle measuring errors(RMS) of the equipment change from less than or equal to 57″ into 21″ for the azimuth, and from 34″ into 17″ for the pitch respectively, when the maximum ship-attitude errors are at the head of 72″, pitch of 24″ and the roll of 24″. The scheme basically meets the precision and stability requirements of the data processing for shipboard optical measurement equipment.
    SHENG Lei, WU Zhi-yong, GAO Shi-jie, LIU Zhi-chun, GAO Ce, WANG Shi-gang. Regression and compensation of measuring data for shipboard theodolite[J]. Optics and Precision Engineering, 2014, 22(9): 2536
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