Jingfa LEI, Yin SUN, Miao ZHANG, Yongling LI, Ruhai ZHAO, Hong SUN. Topography Measurement of Strongly Reflective Surfaces Based on Improved Automatic Multi-exposure and Digital Raster Projection Technology[J]. Acta Photonica Sinica, 2023, 52(12): 1212004

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- Acta Photonica Sinica
- Vol. 52, Issue 12, 1212004 (2023)
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