Laser-induced defects in optical multilayer coatings by the spatial resolved method

Chong Shan; Yuanan Zhao; Yanqi Gao; Xiaohui Zhao; Guohang Hu; Weixin Ma; Jianda Shao

doi:10.3788/COL201917.031403

Journals >Chinese Optics Letters >Volume 17 >Issue 3 >Page 031403 > Article

Chinese Optics Letters
Vol. 17, Issue 3, 031403 (2019)

Laser-induced defects in optical multilayer coatings by the spatial resolved method

Chong Shan¹, Yuanan Zhao^2,3,*, Yanqi Gao^1,4, Xiaohui Zhao¹..., Guohang Hu², Weixin Ma¹ and Jianda Shao^2,**|Show fewer author(s)

Author Affiliations

¹Shanghai Institute of Laser Plasma, China Academy of Engineering Physics, Shanghai 201800, China

²Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

³State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China

⁴IFSA Collaborative Innovation Center, Shanghai Jiao Tong University, Shanghai 200240, China

show less

DOI: 10.3788/COL201917.031403 Cite this Article Set citation alerts

Chong Shan, Yuanan Zhao, Yanqi Gao, Xiaohui Zhao, Guohang Hu, Weixin Ma, Jianda Shao, "Laser-induced defects in optical multilayer coatings by the spatial resolved method," Chin. Opt. Lett. 17, 031403 (2019) Copy Citation Text

EndNote(RIS)

BibTex

Plain Text

show less

Abstract

The spatial resolved method, which measures the laser-induced damage fluence by identifying the location of the damage point in the Gaussian beam three-dimensional direction, is demonstrated. The advantages and practicality of this method have been explained. Taking a triple frequency beam splitter as an example, the defect damage fluence can be accurately calculated by the spatial resolved method. The different defect damage performance of the triple frequency splitter is distinguished under irradiations of only the 355 and 532 nm lasers. The spatial resolved method provides a way to obtain precise information of optical film defect information.