• Laser & Optoelectronics Progress
  • Vol. 52, Issue 6, 60004 (2015)
Quan Haiyang1,2,*, Hou Xi1, and Wu Fan1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/lop52.060004 Cite this Article Set citation alerts
    Quan Haiyang, Hou Xi, Wu Fan. Research Status and Progress of Measurement Uncertainty in Interferometric Testing of Surface Figure[J]. Laser & Optoelectronics Progress, 2015, 52(6): 60004 Copy Citation Text show less
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