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    Journals >Laser & Optoelectronics Progress >Volume 56 >Issue 9 >Page 091501 > Article
    • Laser & Optoelectronics Progress
    • Vol. 56, Issue 9, 091501 (2019)
    Machine-Vision Based Defect Detection Algorithm for Packaging Bags
    Dan Li*, Guojun Bai, Yuanyuan Jin, and Yan Tong
    Author Affiliations
  • Department of Information and Control Engineering, Shenyang Urban Construction University, Shenyang, Liaoning 110167, China
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    DOI: 10.3788/LOP56.091501 Cite this Article Set citation alerts
    Dan Li, Guojun Bai, Yuanyuan Jin, Yan Tong. Machine-Vision Based Defect Detection Algorithm for Packaging Bags[J]. Laser & Optoelectronics Progress, 2019, 56(9): 091501 Copy Citation Text show less
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    Article index updated: Mar. 29, 2025
    The article is cited by 6 article(s) CLP online library. (Some content might be in Chinese.)
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    Dan Li, Guojun Bai, Yuanyuan Jin, Yan Tong. Machine-Vision Based Defect Detection Algorithm for Packaging Bags[J]. Laser & Optoelectronics Progress, 2019, 56(9): 091501
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    Paper Information
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