Han GUO, Wang ZHAO, Shuai WANG, Ping YANG, Lisong YAN, Shenghu LIU, Hongli GUAN, Chensi ZHAO. Subspot Background Noise Removal Method Based on Bezier Surface Fitting[J]. Acta Photonica Sinica, 2024, 53(8): 0801003
- Acta Photonica Sinica
- Vol. 53, Issue 8, 0801003 (2024)
Fig. 1. Bezier surface
Fig. 2. The influence of the position and number of control points on the fitting results
Fig. 3. Selected control points for Bessel surface fitting with a single sub-aperture
Fig. 4. Skylight background simulation results
Fig. 5. Denoising results of each method under skylight background only
Fig. 6. Influence of sub-spot on surface fitting results
Fig. 7. The result of processing the spot image under the interference of sky light background by different methods
Fig. 8. Error of centroid calculation by different methods when BSR is 100
Fig. 9. BSR of spot array diagram with different off-axis angles of the sun
Fig. 10. Light spot array in different BSR environments
Fig. 11. Results of each method under different BSR conditions
Fig. 12. Optical path diagram of the experimental system
Fig. 13. The denoising results of each method are obtained when there is only background noise
Fig. 14. The influence of actual sub-spot on surface fitting results
Fig. 15. Image processing results with both background noise and light spots
Fig. 16. Experimental results of background separation of spot array image
Fig. 17. Wavefront restoration results of each method
Fig. 18. Error in centroid calculation of 200 experimental data
|
Table 1. The influence of the position and number of control points on structural similarity
|
Table 2. Simulation parameters
|
Table 3. Residual RMS fitted by each method
|
Table 4. The mean error of each method's fitting results
|
Table 5. Peak light intensity of the affected photon spot
|
Table 6. The structural similarity between the affected and unaffected sub-spots
|
Table 7. Wavefront residual RMS recovered by different methods
|
Table 8. Parameters of the experimental device
|
Table 9. The residual RMS was fitted to the data collected by each method
|
Table 10. The peak light intensity after the real photon spot is affected
Set citation alerts for the article
Please enter your email address
© Copyright 2018-2021 | Chinese Laser Press. All Rights Reserved 沪ICP备15018463号-20