• Acta Photonica Sinica
  • Vol. 31, Issue 8, 993 (2002)
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  • [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Time-sequence speckle metrology and its applications[J]. Acta Photonica Sinica, 2002, 31(8): 993 Copy Citation Text show less

    Abstract

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Time-sequence speckle metrology and its applications[J]. Acta Photonica Sinica, 2002, 31(8): 993
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