• Electro-Optic Technology Application
  • Vol. 28, Issue 5, 61 (2013)
ZHAO Ding1,2, ZU Jing1,2, and CUI Chun-sheng1,2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    ZHAO Ding, ZU Jing, CUI Chun-sheng. Low Power Consumption Design of Down-hole Pressure Testing System[J]. Electro-Optic Technology Application, 2013, 28(5): 61 Copy Citation Text show less
    References

    [1] Predicting Pressure Behavior and Dynamic Shock Loads on Completion Hardware During Perforating[R]. Offshore Technology Conference,2010.

    [2] Texas Instruments Incorported MSP430x4xx family User’s Guide[Z]. 2008.

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