• Laser & Optoelectronics Progress
  • Vol. 61, Issue 20, 2011021 (2024)
Runchen Zhang1, Fuyang Zhang1, Tao Yang1,2,*, Wenjin Zeng1, and Xiao Shen3
Author Affiliations
  • 1State Key Laboratory of Organic Electronics and Information Displays, Institute of Advanced Technology, Nanjing University of Posts and Telecommunications, Nanjing 210023, Jiangsu , China
  • 2Henan Institute of Flexible Electronics, Zhengzhou 450046, Henan , China
  • 3College of Electronic and Optical Engineering & College of Flexible Electronics (Future Technology), Nanjing University of Posts and Telecommunications, Nanjing 210023, Jiangsu , China
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    DOI: 10.3788/LOP241297 Cite this Article Set citation alerts
    Runchen Zhang, Fuyang Zhang, Tao Yang, Wenjin Zeng, Xiao Shen. Optimizing Spectral Imaging Quality in Scattering Media[J]. Laser & Optoelectronics Progress, 2024, 61(20): 2011021 Copy Citation Text show less

    Abstract

    Understanding the point spread function (PSF) in scattering media is crucial in various fields such as biomedical imaging, atmospheric science, and optical communication. This study delves into the characteristics of PSF and elucidates the relationship between PSF and different wavelengths in scattering media through theoretical derivation and experimental verification of the light field function. The correlation of PSF at different wavelengths is mainly controlled by the scaling factor and the equivalent phase mask. By analyzing and predicting the equivalent phase mask, this article proposes a weighted average algorithm that successfully estimates PSF under unknown wavelength conditions, thereby improving the quality of image reconstruction compared to traditional algorithms. This work reveals the relationship between PSF and wavelength, providing valuable insights into optimizing imaging quality in scattering environments and analysis of spectral signal characteristics.
    Runchen Zhang, Fuyang Zhang, Tao Yang, Wenjin Zeng, Xiao Shen. Optimizing Spectral Imaging Quality in Scattering Media[J]. Laser & Optoelectronics Progress, 2024, 61(20): 2011021
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