• INFRARED
  • Vol. 45, Issue 10, 30 (2024)
Yi-lin HU, Hai-yan YANG, Xiao-min HOU, Qian LI..., Jia-jia NIU, Fei HAO, Wei-lin SHE and Li-jun WANG|Show fewer author(s)
Author Affiliations
  • North China Research Institute of Electro-Optics, Beijing 100015, China
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    DOI: 10.3969/j.issn.1672-8785.2024.10.005 Cite this Article
    HU Yi-lin, YANG Hai-yan, HOU Xiao-min, LI Qian, NIU Jia-jia, HAO Fei, SHE Wei-lin, WANG Li-jun. Research on the "Crater" Shaped Defects on the Surface of Liquid Phase Epitaxial Cadmium Telluride Mercury Thin Films[J]. INFRARED, 2024, 45(10): 30 Copy Citation Text show less
    References

    [1] Triboulet R, Tromson-Carli A, Lorans D, et al. Substrate Issues for the Growth of Mercury Cadmium Telluride[J]. Journal of Electronic Materials, 1993, 22(8): 827-834.

    [8] Sen S, Liang C S, Rhiger D R, et al. Reduction of CdZnTe Substrate Defects and Relation to Epitaxial HgCdTe Quality[J]. Journal of Electronic Materials, 1996, 25(8): 1188-1195.

    HU Yi-lin, YANG Hai-yan, HOU Xiao-min, LI Qian, NIU Jia-jia, HAO Fei, SHE Wei-lin, WANG Li-jun. Research on the "Crater" Shaped Defects on the Surface of Liquid Phase Epitaxial Cadmium Telluride Mercury Thin Films[J]. INFRARED, 2024, 45(10): 30
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