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    Journals >Optical Instruments >Volume 29 >Issue 3 >Page 80 > Article
    • Optical Instruments
    • Vol. 29, Issue 3, 80 (2007)
    Spectroscopic ellipsometry characterization of mesoporous Ti-doped SiO2 films optical properties
    [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Spectroscopic ellipsometry characterization of mesoporous Ti-doped SiO2 films optical properties[J]. Optical Instruments, 2007, 29(3): 80 Copy Citation Text show less

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Spectroscopic ellipsometry characterization of mesoporous Ti-doped SiO2 films optical properties[J]. Optical Instruments, 2007, 29(3): 80
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