• Optical Instruments
  • Vol. 44, Issue 1, 63 (2022)
Xinlin YE and Guanjun YOU*
Author Affiliations
  • School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China
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    DOI: 10.3969/j.issn.1005-5630.2022.01.010 Cite this Article
    Xinlin YE, Guanjun YOU. Terahertz near-field microscopic imaging study of monolayer MoS2 and WS2[J]. Optical Instruments, 2022, 44(1): 63 Copy Citation Text show less
    Schematic diagram of THz s-SNOM
    Fig. 1. Schematic diagram of THz s-SNOM
    Optical micrograph of monolayer MoS2 and WS2
    Fig. 2. Optical micrograph of monolayer MoS2 and WS2
    Topography and near-field amplitude of MoS2
    Fig. 3. Topography and near-field amplitude of MoS2
    Graph of monolayer MoS2 and WS2 comparative near-field imaging
    Fig. 4. Graph of monolayer MoS2 and WS2 comparative near-field imaging
    MoS2 photoexcitation electric field simulation diagram
    Fig. 5. MoS2 photoexcitation electric field simulation diagram