• Advanced Photonics
  • Vol. 6, Issue 6, 066002 (2024)
Joonhyuk Seo1,†, Jaegang Jo2, Joohoon Kim3, Joonho Kang4..., Chanik Kang1, Seong-Won Moon3, Eunji Lee5, Jehyeong Hong1,2,4, Junsuk Rho3,5,6,7,8,* and Haejun Chung1,2,4,*|Show fewer author(s)
Author Affiliations
  • 1Hanyang University, Department of Artificial Intelligence, Seoul, Republic of Korea
  • 2Hanyang University, Department of Electronic Engineering, Seoul, Republic of Korea
  • 3Pohang University of Science and Technology, Department of Mechanical Engineering, Pohang, Republic of Korea
  • 4Hanyang University, Department of Artificial Intelligence Semiconductor Engineering, Seoul, Republic of Korea
  • 5Pohang University of Science and Technology, Department of Chemical Engineering, Pohang, Republic of Korea
  • 6Pohang University of Science and Technology, Department of Electrical Engineering, Pohang, Republic of Korea
  • 7POSCO-POSTECH-RIST Convergence Research Center for Flat Optics and Metaphotonics, Pohang, Republic of Korea
  • 8National Institute of Nanomaterials Technology, Pohang, Republic of Korea
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    DOI: 10.1117/1.AP.6.6.066002 Cite this Article Set citation alerts
    Joonhyuk Seo, Jaegang Jo, Joohoon Kim, Joonho Kang, Chanik Kang, Seong-Won Moon, Eunji Lee, Jehyeong Hong, Junsuk Rho, Haejun Chung, "Deep-learning-driven end-to-end metalens imaging," Adv. Photon. 6, 066002 (2024) Copy Citation Text show less

    Abstract

    Recent advances in metasurface lenses (metalenses) have shown great potential for opening a new era in compact imaging, photography, light detection, and ranging (LiDAR) and virtual reality/augmented reality applications. However, the fundamental trade-off between broadband focusing efficiency and operating bandwidth limits the performance of broadband metalenses, resulting in chromatic aberration, angular aberration, and a relatively low efficiency. A deep-learning-based image restoration framework is proposed to overcome these limitations and realize end-to-end metalens imaging, thereby achieving aberration-free full-color imaging for mass-produced metalenses with 10 mm diameter. Neural-network-assisted metalens imaging achieved a high resolution comparable to that of the ground truth image.
    TAC=|ff0|D2f,

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    L(x,y,f)=E(x,f(y))+λΦ(f(y)),

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    LTotal=LPSNR+λLa,

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    LPSNR(x^,x)=10logR2MSE(x^,x),

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    LaD=Ex[max(0,1D(F(x)))]+Ex^[max(0,1+D(F(x^)))],

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    LaG=Ex^[D(F(x^))],

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    Joonhyuk Seo, Jaegang Jo, Joohoon Kim, Joonho Kang, Chanik Kang, Seong-Won Moon, Eunji Lee, Jehyeong Hong, Junsuk Rho, Haejun Chung, "Deep-learning-driven end-to-end metalens imaging," Adv. Photon. 6, 066002 (2024)
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