• Optics and Precision Engineering
  • Vol. 32, Issue 17, 2663 (2024)
Jiawen WANG1, Junqing WU2, Minyang WU1, Yingbiao AN1..., Jingjing LIU2, Bin YAN2,* and Fujun YANG1,*|Show fewer author(s)
Author Affiliations
  • 1School of Civil Engineering, Southeast University, Nanjing289, China
  • 2Department of Orthodontics, The Affiliated Stomatological Hospital of Nanjing Medical University, Nanjing1009, China
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    DOI: 10.37188/OPE.20243217.2663 Cite this Article
    Jiawen WANG, Junqing WU, Minyang WU, Yingbiao AN, Jingjing LIU, Bin YAN, Fujun YANG. Whole-field deformation measurement of clear orthodontic aligner using electronic speckle pattern interferometry[J]. Optics and Precision Engineering, 2024, 32(17): 2663 Copy Citation Text show less

    Abstract

    To objectively and accurately measure the full-field deformation of clear aligners for improved clinical effectiveness and safety, a comprehensive three-dimensional deformation measurement system based on laser electronic speckle pattern interferometry has been established. The specimen's surface is illuminated with a tri-wavelength laser, generating a color speckle pattern. A phase-shift device produces a quasi π/2 phase step for all three color channels. Multi-frame images of the color speckle pattern are captured using a 3CCD color camera. Deformation phases are extracted using a 90° step four-frame technique from the separated red, green, and blue channels. A window-deformable filter effectively denoises the phase fringe patterns, allowing six derivative components to be obtained directly from the three deformation components using a digital differential method. Results show that the system achieves a precision of no more than 2.4'' for micro-rotation and better than 10 με for strain measurements. Experimental results on clear aligners align closely with expected outcomes.
    Jiawen WANG, Junqing WU, Minyang WU, Yingbiao AN, Jingjing LIU, Bin YAN, Fujun YANG. Whole-field deformation measurement of clear orthodontic aligner using electronic speckle pattern interferometry[J]. Optics and Precision Engineering, 2024, 32(17): 2663
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