• Infrared and Laser Engineering
  • Vol. 52, Issue 3, 20220907 (2023)
Yakui Dong1,2, Junliang Liu1,2,*, Linshan Sun1, Yongfu Li1,2..., Shuzhen Fan1,2, Liang Gao1,2, Zhaojun Liu1,3 and Xian Zhao1,2|Show fewer author(s)
Author Affiliations
  • 1Key Laboratory of Laser & Infrared System (Shandong University), Ministry of Education, Qingdao 266237, China
  • 2Center for Optics Research and Engineering (CORE), Shandong University, Qingdao 266237, China
  • 3School of Information Science and Engineering, Shandong University, Qingdao 266237, China
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    DOI: 10.3788/IRLA20220907 Cite this Article
    Yakui Dong, Junliang Liu, Linshan Sun, Yongfu Li, Shuzhen Fan, Liang Gao, Zhaojun Liu, Xian Zhao. Integrated low-noise near-infrared single-photon detector based on InGaAs NFAD (invited)[J]. Infrared and Laser Engineering, 2023, 52(3): 20220907 Copy Citation Text show less
    Schematics of preamplifier-free high-speed hybrid quenching circuit
    Fig. 1. Schematics of preamplifier-free high-speed hybrid quenching circuit
    Structure of integrated low noise InGaAs near-infrared single-photon detector based on NFAD. (a) Section view of the detector; (b) Heat dissipation structure of the detector (The red dashed circle indicates the position which is attached to the anti-interference shielding material, the blue area indicates the contact of NFAD housing and the heat sink)
    Fig. 2. Structure of integrated low noise InGaAs near-infrared single-photon detector based on NFAD. (a) Section view of the detector; (b) Heat dissipation structure of the detector (The red dashed circle indicates the position which is attached to the anti-interference shielding material, the blue area indicates the contact of NFAD housing and the heat sink)
    Waveforms at the non-inverting (solid) and inverting (dashed) inputs of the comparator
    Fig. 3. Waveforms at the non-inverting (solid) and inverting (dashed) inputs of the comparator
    Detection efficiency (Pde) as a function of excess bias
    Fig. 4. Detection efficiency (Pde) as a function of excess bias
    Dark count rate as a function of dead time at different detection efficiencies
    Fig. 5. Dark count rate as a function of dead time at different detection efficiencies
    Total afterpulse probability as a function of dead time at different detection efficiencies
    Fig. 6. Total afterpulse probability as a function of dead time at different detection efficiencies
    Total afterpulse probability versus dead time at different detection efficiencies
    Fig. 7. Total afterpulse probability versus dead time at different detection efficiencies
    Yakui Dong, Junliang Liu, Linshan Sun, Yongfu Li, Shuzhen Fan, Liang Gao, Zhaojun Liu, Xian Zhao. Integrated low-noise near-infrared single-photon detector based on InGaAs NFAD (invited)[J]. Infrared and Laser Engineering, 2023, 52(3): 20220907
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