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    Journals >Opto-Electronic Engineering >Volume 30 >Issue 2 >Page 28 > Article
    • Opto-Electronic Engineering
    • Vol. 30, Issue 2, 28 (2003)
    A 3-D measuring method with grating projection
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese]. A 3-D measuring method with grating projection[J]. Opto-Electronic Engineering, 2003, 30(2): 28 Copy Citation Text show less

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    [in Chinese], [in Chinese], [in Chinese]. A 3-D measuring method with grating projection[J]. Opto-Electronic Engineering, 2003, 30(2): 28
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