Wang Shuai, Wang Bin, Liu Qingwen, Du Jiangbing, Fan Xinyu, He Zuyuan. Advances of key technologies on optical reflectometry with ultra-high spatial resolution[J]. Opto-Electronic Engineering, 2018, 45(9): 170669

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- Opto-Electronic Engineering
- Vol. 45, Issue 9, 170669 (2018)
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