Xu Dong, Wu Tao, He Xingdao, Fang Hui. Measurement of Trace Moisture Based on Integrated Cavity at 1392 nm with High Sensitivity[J]. Laser & Optoelectronics Progress, 2017, 54(6): 63001

Search by keywords or author
- Laser & Optoelectronics Progress
- Vol. 54, Issue 6, 63001 (2017)
Abstract

Set citation alerts for the article
Please enter your email address