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    Journals >Laser & Optoelectronics Progress >Volume 54 >Issue 6 >Page 63001 > Article
    • Laser & Optoelectronics Progress
    • Vol. 54, Issue 6, 63001 (2017)
    Measurement of Trace Moisture Based on Integrated Cavity at 1392 nm with High Sensitivity
    Xu Dong1,2, Wu Tao1,2, He Xingdao1,2, and Fang Hui1,2
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  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/lop54.063001 Cite this Article Set citation alerts
    Xu Dong, Wu Tao, He Xingdao, Fang Hui. Measurement of Trace Moisture Based on Integrated Cavity at 1392 nm with High Sensitivity[J]. Laser & Optoelectronics Progress, 2017, 54(6): 63001 Copy Citation Text show less
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    Article index updated: Mar. 25, 2025
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    Xu Dong, Wu Tao, He Xingdao, Fang Hui. Measurement of Trace Moisture Based on Integrated Cavity at 1392 nm with High Sensitivity[J]. Laser & Optoelectronics Progress, 2017, 54(6): 63001
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    Paper Information
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