The Mg₂Al₄${\text{Si}}_{5-x}$Sn_x${\text{O}}_{18}$ ($0\le x\le 0.20$) ceramics were successfully synthesized via the solid-state reaction method. The XRD results show that the main phase of the ceramics is Mg₂Al₄Si₅${\text{O}}_{18}$. When $x=0$,there is a second phase of Al₂SiO₅. With the increase of x,the content of ${\text{Sn}}^{2+}$ gradually increased,the Al₂SiO₅ phase disappeared,and the SnO₂ and MgAl₂O₄ phases appeared. In addition,the cell volume of the ceramic changes with the increase of x,which indicates that partial ${\text{Sn}}^{2+}$ successfully enters the lattice with ion substitution and lattice distortion. The relative density and ${\epsilon }_r$ are highly correlated. The quality factor (Qf) is not only affected by the relative density but also by the symmetry of the [Si₄Al₂] ring. The bond strength as an evaluation of the stability of the crystal structure determines the magnitude of ${\tau }_f$. Good microwave dielectric properties were achieved for samples at $x=0.04$ with sintering at 1400^∘C: ${\epsilon }_r=4.86$,$\mathrm{\text{Qf}}=17,000$$$GHz and ${\tau }_f=-32$$$ppm/^∘C,demonstrating that Mg₂Al₄${\text{Si}}_{4.96}$${\text{Sn}}_{0.04}$${\text{O}}_{18}$ ceramics are an ideal candidate for microwave electronics.