Jinhao Zhang, Jiangtao Su, Weiyu Xie, Shiyuan Shao, Kuiwen Xu, Wenjun Li. Load mismatch effects to heterojunction bipolar transistor device based on waveform measurement[J]. High Power Laser and Particle Beams, 2024, 36(1): 013006

Search by keywords or author
- High Power Laser and Particle Beams
- Vol. 36, Issue 1, 013006 (2024)

Fig. 1. Block diagram of load mismatch measurement system

Fig. 2. Photograph of real-time load pull measurement system

Fig. 3. Parasitic model and comparison about deembedding

Fig. 4. Power sweep under optimal load impedance

Fig. 5. Locations of impedance point for ruggedness test

Fig. 6. Characteristic of HBT under 2nd harmonic load mismatch

Fig. 7. RF I -V characteristic of HBT under fundamental load mismatch

Fig. 8. DLLs of fundamental and 2nd harmonic ruggedness

Set citation alerts for the article
Please enter your email address