• Infrared and Laser Engineering
  • Vol. 51, Issue 12, 20220154 (2022)
Xinrui Wang1,2, Yongxing Yang1,2, Qitong Li1,2, Changyu Zeng1,2..., Jinpeng Li1,2,3, Saiya Wang3, Xinhua Lai4 and Jinbiao Zhao3|Show fewer author(s)
Author Affiliations
  • 1University of Science and Technology of China, Hefei 230022, China
  • 2Nanjing Research Center of Astronomical Instruments, University of Science and Technology of China, Nanjing 210042, China
  • 3Nanjing Astronomical Instruments Co., Ltd., Chinese Academy of Sciences, Nanjing 210042, China
  • 4Mathematics and Science College, Shanghai Normal University, Shanghai 200234, China
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    DOI: 10.3788/IRLA20220154 Cite this Article
    Xinrui Wang, Yongxing Yang, Qitong Li, Changyu Zeng, Jinpeng Li, Saiya Wang, Xinhua Lai, Jinbiao Zhao. 2 m plane mirror measurement technology using unit excitation and reverse calculation[J]. Infrared and Laser Engineering, 2022, 51(12): 20220154 Copy Citation Text show less
    Schematic diagram of Ritchey-Common detection principle
    Fig. 1. Schematic diagram of Ritchey-Common detection principle
    Schematic diagram of closed-loop detection principle
    Fig. 2. Schematic diagram of closed-loop detection principle
    System wave aberration distribution in pupil coordinate system
    Fig. 3. System wave aberration distribution in pupil coordinate system
    Wave aberration distribution of system obtained by reverse calculation of optical software
    Fig. 4. Wave aberration distribution of system obtained by reverse calculation of optical software
    Comparison between the random disturbance recovery plane and the standard plane
    Fig. 5. Comparison between the random disturbance recovery plane and the standard plane
    Wave aberration distribution of system obtained by direct simulation
    Fig. 6. Wave aberration distribution of system obtained by direct simulation
    Wave aberration distribution of system obtained by reverse calculation of optical software
    Fig. 7. Wave aberration distribution of system obtained by reverse calculation of optical software
    Test result diagram of Φ2.7 m spherical mirror
    Fig. 8. Test result diagram of Φ2.7 m spherical mirror
    Result diagram of Φ2 m plane mirror error
    Fig. 9. Result diagram of Φ2 m plane mirror error
    Schematic diagram of testing 2 m flat mirror
    Fig. 10. Schematic diagram of testing 2 m flat mirror
    Schematic diagrams of Φ2.7 m spherical mirror and Φ2 m plane mirror
    Fig. 11. Schematic diagrams of Φ2.7 m spherical mirror and Φ2 m plane mirror
    Track and test the change of Zernike coefficient of 2 m flat mirror shape
    Fig. 12. Track and test the change of Zernike coefficient of 2 m flat mirror shape
    System wave aberration distribution in pupil coordinate system
    Fig. 13. System wave aberration distribution in pupil coordinate system
    Restored plane shape
    Fig. 14. Restored plane shape
    Wave aberration distribution of system obtained by reverse calculation of optical software
    Fig. 15. Wave aberration distribution of system obtained by reverse calculation of optical software
    Result diagram ofΦ2 m plane mirror eccentricity error
    Fig. 16. Result diagram ofΦ2 m plane mirror eccentricity error
    Standard flatAverage surface shape recovered from the first 5 disturbancesAverage surface shape recovered from the first 10 disturbancesAverage surface shape recovered from the first 15 disturbancesAverage surface shape recovered from the first 20 disturbances
    Solve the RMS of the surface0.03430.03310.03410.03400.0344
    RMS minus the pixels corresponding to the standard plane00.00360.00310.00230.0019
    Table 1. Calculating the average of the randomly disturbed plane
    Xinrui Wang, Yongxing Yang, Qitong Li, Changyu Zeng, Jinpeng Li, Saiya Wang, Xinhua Lai, Jinbiao Zhao. 2 m plane mirror measurement technology using unit excitation and reverse calculation[J]. Infrared and Laser Engineering, 2022, 51(12): 20220154
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