• Infrared and Laser Engineering
  • Vol. 53, Issue 6, 20240079 (2024)
Yang DUAN1,2, Zhongxi LIN1,*, and Hui SU1,3,4
Author Affiliations
  • 1Key Laboratory of Optoelectronic Materials Chemistry and Physics, Fujian Institute of Research on the Structure of Matter, Chinese Academy of Sciences, Fuzhou 350002, China
  • 2University of Chinese Academy of Sciences, Beijing 101408, China
  • 3Fujian Science & Technology Innovation Laboratory for Optoelectronic Information of China, Fuzhou 350108, China
  • 4Fujian Z.K. Litecore Co, Ltd, Fuzhou 350003, China
  • show less
    DOI: 10.3788/IRLA20240079 Cite this Article
    Yang DUAN, Zhongxi LIN, Hui SU. 1.74 μm mode-locked semiconductor laser with a high-strained InGaAs/InGaAsP multi-quantum wells structure[J]. Infrared and Laser Engineering, 2024, 53(6): 20240079 Copy Citation Text show less
    (a) 1.7 μm epitaxy structure with high-strained InGaAs/InGaAsP multi-quantum wells; (b)The scanning electron microscope (SEM) picture of the cross-section of the device, the inset shows fundamental transverse mode of the ridge waveguide; (c) Top view of colliding-pulse mode-locked laser
    Fig. 1. (a) 1.7 μm epitaxy structure with high-strained InGaAs/InGaAsP multi-quantum wells; (b)The scanning electron microscope (SEM) picture of the cross-section of the device, the inset shows fundamental transverse mode of the ridge waveguide; (c) Top view of colliding-pulse mode-locked laser
    Schematic diagram of measuring RF spectrum
    Fig. 2. Schematic diagram of measuring RF spectrum
    (a) A typical cavity length dependence of the inverse external differential quantum efficiency; (b) P-I curves of mode-locked laser at different reverse bias voltage VSA
    Fig. 3. (a) A typical cavity length dependence of the inverse external differential quantum efficiency; (b) P-I curves of mode-locked laser at different reverse bias voltage VSA
    (a) The RF spectrum measured at a driving current of 520 mA and a reverse bias voltage of −1.6 V. The inset shows the RF peak at the fundamental repetition frequency; (b) The pulse train measured at a driving current of 520 mA and a reverse bias voltage of −1.6 V
    Fig. 4. (a) The RF spectrum measured at a driving current of 520 mA and a reverse bias voltage of −1.6 V. The inset shows the RF peak at the fundamental repetition frequency; (b) The pulse train measured at a driving current of 520 mA and a reverse bias voltage of −1.6 V
    RF spectrum maps in dBm scale as a function of driving current at different reverse bias voltages. (a) RF spectrum map at reverse bias voltage of −1.4 V; (b) RF spectrum map at reverse bias voltage of −1.6 V; (c) RF spectral map at reverse bias voltage of −1.8 V; (d) RF spectrum map at reverse bias voltage of −2 V
    Fig. 5. RF spectrum maps in dBm scale as a function of driving current at different reverse bias voltages. (a) RF spectrum map at reverse bias voltage of −1.4 V; (b) RF spectrum map at reverse bias voltage of −1.6 V; (c) RF spectral map at reverse bias voltage of −1.8 V; (d) RF spectrum map at reverse bias voltage of −2 V
    (a) Emission spectra of the laser measured at a reverse bias voltage of −1.6 V for different driving currents; (b) Emission spectra of the laser measured at a driving current of 520 mA for different reverse bias voltages
    Fig. 6. (a) Emission spectra of the laser measured at a reverse bias voltage of −1.6 V for different driving currents; (b) Emission spectra of the laser measured at a driving current of 520 mA for different reverse bias voltages
    Yang DUAN, Zhongxi LIN, Hui SU. 1.74 μm mode-locked semiconductor laser with a high-strained InGaAs/InGaAsP multi-quantum wells structure[J]. Infrared and Laser Engineering, 2024, 53(6): 20240079
    Download Citation