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    Journals >Chinese Optics Letters >Volume 16 >Issue 10 >Page 102401 > Article
    • Chinese Optics Letters
    • Vol. 16, Issue 10, 102401 (2018)
    Optical rectification in surface layers of germanium
    Li Zhang1, Fangye Li1, Shuai Wang1, Qi Wang1..., Kairan Luan1, Xi Chen1, Xiuhuan Liu2, Lingying Qiu3, Zhanguo Chen1,*, Jihong Zhao1, Lixin Hou4, Yanjun Gao1 and Gang Jia1|Show fewer author(s)
    Author Affiliations
  • 1State Key Laboratory of Integrated Optoelectronics, College of Electronic Science and Engineering, Jilin University, Changchun 130012, China
  • 2College of Communication Engineering, Jilin University, Changchun 130012, China
  • 3State Key Laboratory of Supramolecular Structure and Materials, Institute of Theoretical Chemistry, Jilin University, Changchun 130012, China
  • 4College of Information Technology, Jilin Agricultural University, Changchun 130118, China
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    DOI: 10.3788/COL201816.102401 Cite this Article Set citation alerts
    Li Zhang, Fangye Li, Shuai Wang, Qi Wang, Kairan Luan, Xi Chen, Xiuhuan Liu, Lingying Qiu, Zhanguo Chen, Jihong Zhao, Lixin Hou, Yanjun Gao, Gang Jia, "Optical rectification in surface layers of germanium," Chin. Opt. Lett. 16, 102401 (2018) Copy Citation Text show less
    Ge samples and the measurement setup of EFI OR. (a) The Ge(001) samples; (b) the Ge(110) samples; (c) the Ge(111) samples; (d) the metal–semiconductor–metal configuration of Ge samples; (e) the measurement system for EFI OR.
    Fig. 1. Ge samples and the measurement setup of EFI OR. (a) The Ge(001) samples; (b) the Ge(110) samples; (c) the Ge(111) samples; (d) the metal–semiconductor–metal configuration of Ge samples; (e) the measurement system for EFI OR.
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    EFI OR signals versus the polarization azimuth of the probing beam in the (a) Ge(001), (b) Ge(110), and (c) Ge(111) surface layers.
    Fig. 2. EFI OR signals versus the polarization azimuth of the probing beam in the (a) Ge(001), (b) Ge(110), and (c) Ge(111) surface layers.
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    Distribution of the normalized EFI OR signals along the normal direction of the Ge crystal. (a) Along the 001 direction for the Ge(001) samples. (b) Along the 110 direction for the Ge(110) samples.
    Fig. 3. Distribution of the normalized EFI OR signals along the normal direction of the Ge crystal. (a) Along the 001 direction for the Ge(001) samples. (b) Along the 110 direction for the Ge(110) samples.
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    Li Zhang, Fangye Li, Shuai Wang, Qi Wang, Kairan Luan, Xi Chen, Xiuhuan Liu, Lingying Qiu, Zhanguo Chen, Jihong Zhao, Lixin Hou, Yanjun Gao, Gang Jia, "Optical rectification in surface layers of germanium," Chin. Opt. Lett. 16, 102401 (2018)
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