• Infrared and Laser Engineering
  • Vol. 52, Issue 6, 20230168 (2023)
Xi Wang1,2, Nanxiang Zhao1,2, Yongning Zhang3, Biyi Wang3..., Xiao Dong1,2, Yan Zou4, Wuhu Lei1,2 and Yihua Hu1,2,*|Show fewer author(s)
Author Affiliations
  • 1State Key Laboratory of Pulsed Power Laser Technology, Electronic Countermeasure Institute, National University of Defense Technology, Hefei 230037, China
  • 2Anhui Laboratory of Advanced Laser Technology, Electronic Countermeasure Institute, National University of Defense Technology, Hefei 230037, China
  • 3National Key Laboratory of Electromagnetic Space Security, Tianjin 300308, China
  • 4Beijing Institute of Aerospace Control Devices, Beijing 100094, China
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    DOI: 10.3788/IRLA20230168 Cite this Article
    Xi Wang, Nanxiang Zhao, Yongning Zhang, Biyi Wang, Xiao Dong, Yan Zou, Wuhu Lei, Yihua Hu. Irradiation effect of 2.79 μm mid-infrared laser on CMOS image sensor[J]. Infrared and Laser Engineering, 2023, 52(6): 20230168 Copy Citation Text show less
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    Xi Wang, Nanxiang Zhao, Yongning Zhang, Biyi Wang, Xiao Dong, Yan Zou, Wuhu Lei, Yihua Hu. Irradiation effect of 2.79 μm mid-infrared laser on CMOS image sensor[J]. Infrared and Laser Engineering, 2023, 52(6): 20230168
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