Researching

Journals
  • Advanced Photonics
  • Photonics Insights
  • Advanced Photonics Nexus
  • Photonics Research
  • Advanced Imaging
  • View All Journals
  • Chinese Optics Letters
  • High Power Laser Science and Engineering
    • Articles
  • Optics
  • Physics
  • Geography
  • View All Subjects
    • Conferences
  • CIOP
  • HPLSE
  • AP
  • View All Events
    • News
    About CLP
    Search by keywords or author
    Journals >Laser & Optoelectronics Progress >Volume 56 >Issue 10 >Page 102802 > Article
    • Laser & Optoelectronics Progress
    • Vol. 56, Issue 10, 102802 (2019)
    Cloud Detectionof ZY-3 Remote Sensing Images Based on Fully Convolutional Neural Network and Conditional Random Field
    Liang Pei, Yang Liu*, and Lin Gao
    Author Affiliations
  • School of Geomatics, Liaoning Technical University, Fuxin, Liaoning 123000, China
    • show less
    DOI: 10.3788/LOP56.102802 Cite this Article Set citation alerts
    Liang Pei, Yang Liu, Lin Gao. Cloud Detectionof ZY-3 Remote Sensing Images Based on Fully Convolutional Neural Network and Conditional Random Field[J]. Laser & Optoelectronics Progress, 2019, 56(10): 102802 Copy Citation Text show less
    Cited By
    Article index updated: Mar. 25, 2025
    The article is cited by 2 article(s) CLP online library. (Some content might be in Chinese.)
    Abstract
    Get PDF(in Chinese)
    Figures&Tables (6)
    Equations (0)
    References (16)
    Cited By (2)
    Get Citation
    Copy Citation Text
    Liang Pei, Yang Liu, Lin Gao. Cloud Detectionof ZY-3 Remote Sensing Images Based on Fully Convolutional Neural Network and Conditional Random Field[J]. Laser & Optoelectronics Progress, 2019, 56(10): 102802
    Download Citation
    Set citation alerts for the article
    Tools
    Share
    Set citation alerts for the article
    Save the article for my favorites
    Paper Information
    Recommended Topics
    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology