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    Journals >Opto-Electronic Engineering >Volume 30 >Issue 3 >Page 62 > Article
    • Opto-Electronic Engineering
    • Vol. 30, Issue 3, 62 (2003)
    An Inversion Analysis Method Based on Multi-Shift Imaging for Improvement of CCD Imaging Resolution
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. An Inversion Analysis Method Based on Multi-Shift Imaging for Improvement of CCD Imaging Resolution[J]. Opto-Electronic Engineering, 2003, 30(3): 62 Copy Citation Text show less

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. An Inversion Analysis Method Based on Multi-Shift Imaging for Improvement of CCD Imaging Resolution[J]. Opto-Electronic Engineering, 2003, 30(3): 62
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