Bing YU. Progress and prospects in national defense optical metrology technology[J]. Journal of Applied Optics, 2022, 43(4): 565
- Journal of Applied Optics
- Vol. 43, Issue 4, 565 (2022)
Fig. 1. Physical photo of calibration device of contrast distortion for visible light resolution transfer function
Fig. 2. Physical photo of calibration device for visible light image plane uniformity
Fig. 3. Field experiment of infrared radiation of engine
Fig. 4. Physical photo of calibration device of terahertz source radiation parameters
Fig. 5. Physical photo of calibration device of linearity and wavelength of terahertz time-domain spectrometer
Fig. 6. Schematic diagram of transmittance-reflection ratio measuring device of micro-nano structure space
Fig. 7. Overall design diagram of tracking accuracy calibration device
Fig. 8. Physical photo of calibration device of missile system multi-spectral stealth
Fig. 9. Physical photo of calibration device of imaging seeker photoelectric detection equipment
Fig. 10. Physical photo of calibration device of multi-axial photoelectric system
Fig. 11. Support technology system of military test instruments
Fig. 12. Measuring principle of laser polarization measuring instrument and its 3D model
Fig. 13. Physical photo of infrared materials emissivity measuring instrument
Fig. 14. Center deviation measuring instrument for dual-band optical elements
Fig. 15. Three-dimensional design diagram of TV imaging performance parameter measuring instrument
Fig. 16. Schematic diagram of infrared scanning radiometer composition
Fig. 17. Structure diagram of picowatt laser power and energy meter prototype
Fig. 18. Three-dimensional model of ultrashort laser pulse width tester
Fig. 19. Working principle diagram of UV visible light high-resolution image correction spectrometer
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Table 1. Highest metrological standard indexes of national defense for laser parameter metrology major
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Table 2. Highest metrological standard indexes of national defense for spectral photometric chromaticity metrology major
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