HE Jinfeng, GUAN Zhijin, CHENG Xueyun, YU Keren, XU Mingqiang. Fault detection and location for quantum circuits based on NCV gates[J]. Chinese Journal of Quantum Electronics, 2015, 32(2): 161

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- Chinese Journal of Quantum Electronics
- Vol. 32, Issue 2, 161 (2015)
Abstract

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