• Laser & Optoelectronics Progress
  • Vol. 59, Issue 14, 1415004 (2022)
Yonghong Wang1,2,*, Yanfeng Yao1, Junrui Li1,2, Peizheng Yan1,2..., Chen Li1 and Shuangle Wu1|Show fewer author(s)
Author Affiliations
  • 1School of Instrument Science and Opto-Electronics Engineering, Hefei University of Technology, Hefei 230009, Anhui , China
  • 2Anhui Province Key Laboratory of Measuring Theory and Precision Instrument, Hefei University of Technology, Hefei 230009, Anhui , China
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    DOI: 10.3788/LOP202259.1415004 Cite this Article Set citation alerts
    Yonghong Wang, Yanfeng Yao, Junrui Li, Peizheng Yan, Chen Li, Shuangle Wu. Progresses of Shearography: Key Technologies and Applications[J]. Laser & Optoelectronics Progress, 2022, 59(14): 1415004 Copy Citation Text show less

    Abstract

    Digital shearing speckle pattern interferometry (DSSPI), also named shearography, is an extensively researched non-contact high-sensitivity optical measurement method. The recent development of shearography, ranging from key technologies to applications is presented in detail within this paper. The new technologies of shearography, such as spatial phase-shifting shear interferometry, multi-directional shear interferometry, and multi-functional multiplex measurement, are described in detail, and their applications in nondestructive testing in aerospace, automobile, machinery, new materials, and other fields are introduced. At the end of the article, the pros and cons of shearography are analyzed, and the potential research content is discussed.
    Yonghong Wang, Yanfeng Yao, Junrui Li, Peizheng Yan, Chen Li, Shuangle Wu. Progresses of Shearography: Key Technologies and Applications[J]. Laser & Optoelectronics Progress, 2022, 59(14): 1415004
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