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    Journals >Opto-Electronic Engineering >Volume 32 >Issue 8 >Page 36 > Article
    • Opto-Electronic Engineering
    • Vol. 32, Issue 8, 36 (2005)
    Non-uniformity correction technique for amorphous silicon flat-panel detector
    1,2, 3, and 2
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese]. Non-uniformity correction technique for amorphous silicon flat-panel detector[J]. Opto-Electronic Engineering, 2005, 32(8): 36 Copy Citation Text show less

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    [in Chinese], [in Chinese], [in Chinese]. Non-uniformity correction technique for amorphous silicon flat-panel detector[J]. Opto-Electronic Engineering, 2005, 32(8): 36
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