Dongdong YUE, Guanjun YOU. Study on scattering-type terahertz scanning near-field optical microscopy[J]. Optical Instruments, 2020, 42(2): 64
- Optical Instruments
- Vol. 42, Issue 2, 64 (2020)
Fig. 1. Dipole model
Fig. 2. Calculated results based on the dipole model
Fig. 3. Terahertz scattering-type scanning near-field microscope system and near-field approach curves
Fig. 4. AFM topography and THz near-field microscopy images of gold thin film/silicon substrate
Fig. 5. AFM topography and THz near-field microscopy images of few-layer Graphene on SiO2/Si substrate
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