It is significant to study the effect of irradiation on the Charge Coupled Device (CCD) in order to correctly use it in irradiation environment. In this paper, we choose the ICX285 array CCD as the experimental sample. To satisfy the ionizing radiation effects experiments specifications, an off-line array CCD test system is presented to meet the demand of ionizing irradiation measurement, which contains a radiation circuit card and a test device for this array CCD. The system has two special functions: programmable integral time and overscanning dummy pixels controlling. It has been applied for the experiments of ionizing radiation effects on array CCDs with an 60Co-γ ray source, and has played an important role in understanding of the dark signal changes of array CCD after ionizing radiation damage.作者简介：罗通顶(1984-)，男(侗族)，湖南邵阳人。工程师