• Optoelectronic Technology
  • Vol. 43, Issue 3, 191 (2023)
Qing LI1,5, Omolola E. Fayemi2, Jun XU3, Kun WU3..., Jianming ZHOU4 and Wei LEI1,5|Show fewer author(s)
Author Affiliations
  • 1School of Electronic Science and Engineering, Joint International Research Laboratory of Information Display and Visualization, Southeast University, Nanjing 2008,CHN
  • 2Department of Chemistry, Faculty of Natural and Agricultural Sciences, North‑West University (Mafikeng 5 Campus), Private Bag X046, Mmabatho 735, South Africa
  • 3Nanjing Perlove Medical Equipment Corporation, Nanjing 211111,CHN
  • 4Suzhou Yi He Photoelectron Science and Technology Ltd., Suzhou Jiangsu 215100,CHN
  • 5Shi‑Cheng Laboratory for Information Display and Visualization,Nanjing 210024
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    DOI: 10.19453/j.cnki.1005-488x.2023.03.001 Cite this Article
    Qing LI, Omolola E. Fayemi, Jun XU, Kun WU, Jianming ZHOU, Wei LEI. Research on Spectral Detection Performance of Semiconductor pin Junction with Multilayer Bandgap Structure[J]. Optoelectronic Technology, 2023, 43(3): 191 Copy Citation Text show less
    References

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    Qing LI, Omolola E. Fayemi, Jun XU, Kun WU, Jianming ZHOU, Wei LEI. Research on Spectral Detection Performance of Semiconductor pin Junction with Multilayer Bandgap Structure[J]. Optoelectronic Technology, 2023, 43(3): 191
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