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    Journals >Opto-Electronic Engineering >Volume 34 >Issue 6 >Page 44 > Article
    • Opto-Electronic Engineering
    • Vol. 34, Issue 6, 44 (2007)
    Numerical simulation of infrared nondestructive testing based on transient heating with high energy
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Numerical simulation of infrared nondestructive testing based on transient heating with high energy[J]. Opto-Electronic Engineering, 2007, 34(6): 44 Copy Citation Text show less

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Numerical simulation of infrared nondestructive testing based on transient heating with high energy[J]. Opto-Electronic Engineering, 2007, 34(6): 44
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