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    Journals >Opto-Electronic Engineering >Volume 32 >Issue 7 >Page 59 > Article
    • Opto-Electronic Engineering
    • Vol. 32, Issue 7, 59 (2005)
    New method for 3D measurement based on image sequence
    1,2, 1, and 1
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  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese]. New method for 3D measurement based on image sequence[J]. Opto-Electronic Engineering, 2005, 32(7): 59 Copy Citation Text show less

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    [in Chinese], [in Chinese], [in Chinese]. New method for 3D measurement based on image sequence[J]. Opto-Electronic Engineering, 2005, 32(7): 59
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