• Chinese Journal of Quantum Electronics
  • Vol. 21, Issue 6, 873 (2004)
[in Chinese]1,* and [in Chinese]2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese]. Study on two wavelength fiber sensor for measuring surface roughness and its measuring error[J]. Chinese Journal of Quantum Electronics, 2004, 21(6): 873 Copy Citation Text show less
    References

    [3] Henning H, Christof K. Soft X-ray scattering from rough surface: experimental and theoretical analysis [J]. Appl.Opt., 1987, 26(4): 2851-2859.

    [6] Jin W, Stewart G, Culshaw B. Source noise limitation in an optical methane detection system using a broadband source [J]. Appl. Opt., 1995, 34(13): 2345-2349.

    [7] Jin W, Stewart G, Philp W, et al. Limitation of absorption-based fibre optic gas sensors by coherent reflections [J]. Appl. Opt., 1997, 36(25): 6251-6255.

    CLP Journals

    [1] Zhu Nannan, Zhang Jun. Multi-wavelength fiber sensor for measuring surface roughness based on laser scattering[J]. Infrared and Laser Engineering, 2016, 45(5): 522003

    [in Chinese], [in Chinese]. Study on two wavelength fiber sensor for measuring surface roughness and its measuring error[J]. Chinese Journal of Quantum Electronics, 2004, 21(6): 873
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