The LBRDF(1.06 μm) ,equivalent optical constant dispersion, specular reflectivity spectrum and total hemisphere reflectivity spectrum of gilded film, plating aluminous adiabatic material and silicic compound for rough surfaces are measured. The methods of specular reflective intensity are utilized to calculate the root mean square of the gilded film and adiabatic material surface roughness. Based on measured data of LBRDF, the poly-parameter genetic optimized algorithms are utilized to create statistical BRDF model of above-mentioned material. According to the ellipsometry measuring the optical constants, the Powell optimum method is used to deduce these data with certain wavelength for adiabatic material in different waveband.