• Electro-Optic Technology Application
  • Vol. 26, Issue 5, 68 (2011)
AN Ying and HU Juan
Author Affiliations
  • [in Chinese]
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    DOI: Cite this Article
    AN Ying, HU Juan. Micro-resistance Measuring System of Low Measuring Current[J]. Electro-Optic Technology Application, 2011, 26(5): 68 Copy Citation Text show less

    Abstract

    In order to solve the problem of the excessive current and low precision in micro-resistance mea? surement at present, a design for the micro-resistance measuring system of the low measuring current is intro? duced. Taking the constant current source with high precision as current source, the precision amplifying circuit based on a operational amplifier ICL7650 and OP07ADJ with very low drift and low noise,through the real-time data acquisition and A/D converter, the data are processed and displayed by MCU, and the magnify principle of the weak signal and the feasibility of the measurement are analyzed. The experiment shows that the micro-resis? tance is precisely measured under the low measuring current, the measuring accuracy reaches 1/1 000 when the measuring resistance is 0.05 ~0.5 Ωand the measuring current is 5~10 mA.