• Electro-Optic Technology Application
  • Vol. 26, Issue 5, 68 (2011)
AN Ying and HU Juan
Author Affiliations
  • [in Chinese]
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    DOI: Cite this Article
    AN Ying, HU Juan. Micro-resistance Measuring System of Low Measuring Current[J]. Electro-Optic Technology Application, 2011, 26(5): 68 Copy Citation Text show less
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