High Temperature Interfacial Stability of Fe/Bi0.5Sb1.5Te3 Thermoelectric Elements

Xu WANG; Ming GU; Jincheng LIAO; Qingfeng SONG; Xun SHI; Shengqiang BAI; Lidong CHEN

doi:10.15541/jim20200126

Journals >Journal of Inorganic Materials >Volume 36 >Issue 2 >Page 197 > Article

Journal of Inorganic Materials
Vol. 36, Issue 2, 197 (2021)

High Temperature Interfacial Stability of Fe/Bi_0.5Sb_1.5Te₃Thermoelectric Elements

Xu WANG^1,2, Ming GU¹, Jincheng LIAO¹, Qingfeng SONG¹..., Xun SHI¹, Shengqiang BAI^1,* and Lidong CHEN^1,2|Show fewer author(s)

Author Affiliations

¹1. State Key Laboratory of High Performance Ceramics and Superfine Microstructure, Shanghai Institute of Ceramics, Chinese Academy of Sciences, Shanghai 201899, China

²2. Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China

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DOI: 10.15541/jim20200126 Cite this Article

Xu WANG, Ming GU, Jincheng LIAO, Qingfeng SONG, Xun SHI, Shengqiang BAI, Lidong CHEN. High Temperature Interfacial Stability of Fe/Bi_0.5Sb_1.5Te₃Thermoelectric Elements[J]. Journal of Inorganic Materials, 2021, 36(2): 197 Copy Citation Text

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. Low magnification SEM images of the micro-interfaces in the as-prepared co-sintered sample for screening of the barrier layer materials (a) Cr, Fe, Co, Ti; (b) Al, Zr

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. Surface mapping of the micro-interfaces between P-BT matrix and 6 barrier layer candidate particles aged at 300 ℃ for 2 d

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. (a) Interfacial microstructure of the as-prepared Fe/P-BT TE element before aging and (b) line scanning of the as-prepared Fe/P-BT interface

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. Cross sectional microstructures of the Fe/P-BT interface after aging at different temperatures for different time

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. (a) Variation of the diffusion layer thickness at the Fe/P-BT interface with the square root of aging time at 300, 325 and 350 ℃, and (b) variation of lnD with 1000/T between 300 and 350 ℃

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. Evolution of the Fe/P-BT interfacial resistivity with aging time at 350 ℃

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Temperature/℃	D/(×10^-18, m²∙s^-1)	(Y-Y₀)/μm	Predicted service life*/d
300	7.29	2.7×10^-3t^0.5	428
325	65.1	8.1×10^-3t^0.5	52
350	203.1	14.3×10^-3t^0.5	16

Table 1.

Fitting results of the growth rates of the diffusion layers, the relationship between diffusion layer thickness and aging time, and predicted service lives of the Fe/P-BT element at different temperatures