• Laser & Optoelectronics Progress
  • Vol. 59, Issue 14, 1415003 (2022)
Haibo Luo1,2,3,*, Junfeng Cao1,2,3,4, Xingqin Gai5, and Qinghai Ding6
Author Affiliations
  • 1Key Laboratory of Opto-Electronic Information Processing, Chinese Academy of Sciences, Shenyang 110016, Liaoning , China
  • 2Shenyang Institute of Automation, Chinese Academy of Sciences, Shenyang 110016, Liaoning , China
  • 3Institutes for Robotics and Intelligent Manufacturing, Chinese Academy of Sciences, Shenyang 110169, Liaoning , China
  • 4University of Chinese Academy of Sciences, Beijing 100049, China
  • 5Hebei Hanguang Heavy Industry Co., Ltd., Handan 056107, Hebei , China
  • 6Space Star Technology Co., Ltd., Beijing 100086, China
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    DOI: 10.3788/LOP202259.1415003 Cite this Article Set citation alerts
    Haibo Luo, Junfeng Cao, Xingqin Gai, Qinghai Ding. Industrial Vision Based on Polarization Imaging and Its Key Technologies[J]. Laser & Optoelectronics Progress, 2022, 59(14): 1415003 Copy Citation Text show less
    Schematic of division-of-focal-plane IMX250MZR polarimeter[9]
    Fig. 1. Schematic of division-of-focal-plane IMX250MZR polarimeter[9]
    Traditional imaging and polarization imaging for glass. (a) Traditional imaging; (b) polarization imaging
    Fig. 2. Traditional imaging and polarization imaging for glass. (a) Traditional imaging; (b) polarization imaging
    Imaging of iron, aluminum, copper, silt, rubber, and cotton materials[14]
    Fig. 3. Imaging of iron, aluminum, copper, silt, rubber, and cotton materials[14]
    Schematic of CMOS sensor function division[18]
    Fig. 4. Schematic of CMOS sensor function division[18]
    Measurement process of polarization 3D imaging
    Fig. 5. Measurement process of polarization 3D imaging
    System layout of polarization imaging-based phase measurement[33]
    Fig. 6. System layout of polarization imaging-based phase measurement[33]
    Flowchart of phase measurement
    Fig. 7. Flowchart of phase measurement
    System layout of snapshot multi-wavelength microscope[34]
    Fig. 8. System layout of snapshot multi-wavelength microscope[34]
    System layout with RGB laser and red LED as source[34]
    Fig. 9. System layout with RGB laser and red LED as source[34]
    MethodDesign feature

    Fabrication-integration

    Issues,Cost

    Misregistration issue
    Rotating element

    • Robust

    • Relatively small

    • Not suitable for dynamic scenes

    • Easiest to implement

    • Inexpensive

    • Scene and platform motion

    • Beam wander not a problem or removed in software

    • Misregistration is linear

    Division of amplitude(multiple FPAs)

    • Simultaneous acquisition

    • Large system size

    • High mechanical flexibility and rigidity required

    • Expensive

    • Large

    • Must register multiple FPAs

    • Misregistration can be fixed

    • Can be nonlinear

    Division of aperture

    (single FPA)

    • Simultaneous acquisition

    • Smaller size

    • Loss of spatial resolution

    • Expensive

    • Fixed misregistration

    • Can be nonlinear

    Division of focal plane

    • Simultaneous acquisition

    • Small and rugged

    • Loss of spatial resolution

    • Fabrication difficult

    • Alignment difficult

    • Very expensive

    • IFOVs misregistered

    • Requires interpolation

    • Fixed registration

    Coboresight

    • Simultaneous acquisition

    • Best used at long ranges

    • Easy integration

    • Expensive

    • Misregistration not as stable
    Table 1. Technical characteristics of typical polarization imaging methods[1]