Vibhu Srivastava, Prateek Mishra, Sunny, "Impulse response of Ge2Sb2Te5-based ultrafast photodetector integrated with SOI waveguide," Chin. Opt. Lett. 17, 100401 (2019)

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- Chinese Optics Letters
- Vol. 17, Issue 10, 100401 (2019)

Fig. 1. Proposed design for the impulse response analysis of the GST-based PD device.

Fig. 2. For the 150 nm thick on 220 nm thick Si at the time of illumination: (a) potential distribution at 4 V, 2 V, and 0.5 V biasing, (b) electric field distribution for 2 V biasing.

Fig. 3. Carrier current ( ), displacement current ( ), and total current ( ) for a 150 nm thick biased at 2 V illuminated at 1550 nm. The current component’s behavior is shown in the inset.

Fig. 4. for different thicknesses of biased at 2 V for 1550 nm wavelength illumination with the responsivity of both phases of GST at different thicknesses under similar illumination and biasing conditions. The variation in responsivity with thickness at 1550 nm is shown in the inset.

Fig. 5. Total current ( ) for the 150 nm thick and biased at 2 V illuminated at 1550 nm.

Fig. 6. Impulse response of device illuminated at wavelengths of 1150 nm, 1550 nm, and 1850 nm for a 2 V biased 150 nm thick (a) and (b) .
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Table 1. Responsivity and Bandwidth Comparison of aGST and cGST

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